Jacob T Friedlein, Esther Baumann, Kimberly A Briggman, Gabriel M Colacion, Fabrizio R Giorgetta, Aaron M Goldfain, Daniel I Herman, Eli V Hoenig, Jeeseong Hwang, Nathan R Newbury, Edgar F Perez, Christopher S Yung, Ian Coddington, Kevin C Cossel
Author Information
Jacob T Friedlein: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Esther Baumann: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Kimberly A Briggman: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Gabriel M Colacion: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Fabrizio R Giorgetta: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Aaron M Goldfain: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA. ORCID
Daniel I Herman: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Eli V Hoenig: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Jeeseong Hwang: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Nathan R Newbury: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Edgar F Perez: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Christopher S Yung: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA. ORCID
Ian Coddington: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA.
Kevin C Cossel: National Institute of Standards and Technology, Applied Physics Division, 325 Broadway, Boulder, CO, 80305, USA. kevin.cossel@nist.gov. ORCID
Spectrally resolved photoacoustic imaging is promising for label-free imaging in optically scattering materials. However, this technique often requires acquisition of a separate image at each wavelength of interest. This reduces imaging speeds and causes errors if the sample changes in time between images acquired at different wavelengths. We demonstrate a solution to this problem by using dual-comb spectroscopy for photoacoustic measurements. This approach enables a photoacoustic measurement at thousands of wavelengths simultaneously. In this technique, two optical-frequency combs are interfered on a sample and the resulting pressure wave is measured with an ultrasound transducer. This acoustic signal is processed in the frequency-domain to obtain an optical absorption spectrum. For a proof-of-concept demonstration, we measure photoacoustic signals from polymer films. The absorption spectra obtained from these measurements agree with those measured using a spectrophotometer. Improving the signal-to-noise ratio of the dual-comb photoacoustic spectrometer could enable high-speed spectrally resolved photoacoustic imaging.
