The Segment Anything Model (SAM), a profound vision foundation model pretrained on a large-scale dataset, breaks the boundaries of general segmentation and sparks various downstream applications. This paper introduces Hi-SAM, a unified model leveraging SAM for hierarchical text segmentation. Hi-SAM excels in segmentation across four hierarchies, including pixel-level text, word, text-line, and paragraph, while realizing layout analysis as well. Specifically, we first turn SAM into a high-quality pixel-level text segmentation (TS) model through a parameter-efficient fine-tuning approach. We use this TS model to iteratively generate the pixel-level text labels in a semi-automatical manner, unifying labels across the four text hierarchies in the HierText dataset. Subsequently, with these complete labels, we launch the end-to-end trainable Hi-SAM based on the TS architecture with a customized hierarchical mask decoder. During inference, Hi-SAM offers both automatic mask generation (AMG) mode and promptable segmentation (PS) mode. In the AMG mode, Hi-SAM segments pixel-level text foreground masks initially, then samples foreground points for hierarchical text mask generation and achieves layout analysis in passing. As for the PS mode, Hi-SAM provides word, text-line, and paragraph masks with a single point click. Experimental results show the state-of-the-art performance of our TS model: 84.86% fgIOU on Total-Text and 88.96% fgIOU on TextSeg for pixel-level text segmentation. Moreover, compared to the previous specialist for joint hierarchical detection and layout analysis on HierText, Hi-SAM achieves significant improvements: 4.73% PQ and 5.39% F1 on the text-line level, 5.49% PQ and 7.39% F1 on the paragraph level layout analysis, requiring fewer training epochs.
